mmconference.jpg (3878 Byte)
     

MicroMaterials Conference "MicroMat 1997"
Berlin , April 16 - 18 , 1997

MicroMaterials Homepage MicroMaterials 2000 MicroMaterials Research

MicroMaterials 1997

Contacts

Review of
MicroMaterials '97

Procceedings of
MicroMaterials '97

°

Plenary Lectures

°

Microscopic Testing and Nanomicroscopy

°

Mechanical Testing

°

Advanced Measuring Techniques

°

Packaging

°

Micromechanics

°

Cracks and Fracture in Microcomponents

°

Strain and Stress Properties

°

Thermal Aspects

°

Technological and Environmental Aspects

°

Wide Bandgap Semiconductors

°

Piezoelectric Materials

°

Nanocrystalline and Amorphous Materials

°

Thin Films and Layers

°

Polymeric Materials

°

Ceramics and Superhard Materials

°

Metallization

°

Soldering and Bonding

°

Sensors and Actuators

°

Poster Show

°

Pre-Conference Workshop
Proceedings of Micro Materials '97

8. Strain and Stress Properties

  • Mechanical Stress Measurements Using Micro-Raman Spectroscopy
    (Keynote Lecture)

    De Wolf, I.

    IMEC, Leuven, Belgium

  • A Laser Speckle Correlation Method for Strain Measurements
    of Thin Sheet Materials

    Anwander, M.; Weiss, B.

    Universität Wien, Institut für Materialphysik, Austria

  • Residual Stresses in Microcomponents
    Schubert, A.; Michel, B.

    Fraunhofer Institute IZM Berlin and Chemnitz, Germany

  • Determination and Effects of Residual Stress Fields in Small Areas
    Eigenmann, B.

    Universität Karlsruhe (TH), Institut für Werkstoffkunde I, Germany

  • Some Remarks on Stress State at Interface of the Thin Layer
    in Metal Joints Under Tension

    Ranatowski, E.

    Technical University, Mechanical Department, Bydgoszcz, Poland

  • Strain Distribution Near Si/NiSi2 Interface and Its Effects
    on Electronic Property (Keynote Lecture)

    Wakayama, Y.; Tanaka, S.-I.

    Tanaka Solid Junction Project, ERATO, Yokohama, Japan

  • Measurement of Dynamic Strength With µm-Sized Mechanical
    Structures

    Mazza, E.*; Umeda, A.**; Ueda, K.**; Dual, J.*; Ohta, A.**

    * Institute of Mechanics, ETH Zentrum, Zürich, Switzerland
    ** National Research Laboratory of Metrology, AIST, MITI, Ibaraki, Japan

  • Identification of Shear-Moduli of Microstructures
    Schiltges, G.; Gsell, D.; Dual, J.

    Institute of Mechanics, ETH Zentrum, Zürich, Switzerland

  • Plastic Deformation of Silicon Microelements at High Temperatures
    Frühauf, J.; Franke, C.

    Technische Universität Chemnitz-Zwickau, Zentrum für Mikrotechnologien, Germany

  • Measurement of the Stresses at the Surface of a Silicon Die:
    Application to the Evaluation of a Creep Law of the Sn62Pb36Ag2
    Solder Alloy

    Rey, P.; Woirgard, E.; Zardini, C.

    IXL/ University of Bordeaux, Talence, France

  • Investigations of Relaxation Effects in Cu-Lines on Si-Substrates
    Köhler, B.; Meißner, O.; Melov, V.G.; Schreiber, J.

    Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren, EADQ, Dresden, Germany

  • Creep and Relaxation Behaviour of a Butt Soldered Component
    on PCBs - Mechanical and Metallographic Investigations

    Villain, J.*; Brüller, O.**; Kaltefleiter, J.***

    * Fachhochschule Augsburg, Germany
    ** Technische Universität München, Germany
    *** Siemens AG, Verkehrstechnik, Erlangen, Germany

  • The Behavior of Viscoelastic Minibuffers Under Spring Load
    Brüller, O.*; Villain, J.**

    * Technische Universität München, Germany
    ** Fachhochschule Augsburg, Germany