MicroMaterials 1997

Contacts

Review of
MicroMaterials '97

Procceedings of
MicroMaterials '97

11. Wide Bandgap Semiconductors

• Chemical Vapour Deposition of Diamond for Thermal Management
  and Sensor Applications (Keynote Lecture)
  Koidl, P.; Wild, C.; Wörner, E.
  Fraunhofer-Institut für Angewandte Festkörperphysik, Freiburg i. Br., Germany
  
  
• Degradation of Polycrystalline Diamond and Metal Diamond
  Contacts at High Temperatures (invited)
  Johnston, C.*; Chalker, P.R.*; Crossley, A.*; Werner, M.**
  * AEA Technology plc, Oxfordshire, U.K.
  ** VDI/VDE-IT, Dept. System Integration, Teltow, Germany
  
  
• Influence of Defects on the Young’s Modulus of Polycrystalline
  Diamond
  Szücs, F.*; Moelle, C.*; Klose, S.*; Fecht, H.J.*; Fassbender, S.U.**;
  Meyendorf, N.**; Werner, M.***
  * Technische Universität Berlin, Dept. Material Science, Germany
  ** Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren, Saarbrücken, Germany
  *** VDI/VDE-IT, Dept. System Integration, Teltow, Germany
  
  
• Actuator/Sensor Technology on "Electronic Grade" Diamond Films
  Gluche, P.*; Leuner, R.*; Vescan, A.*; Ebert, W.*; Kohn, E.*; Rembe, C.**;
  aus der Wiesche, S.**; Hofer, E.P.**
  University of Ulm, Germany
  * Dept. Electron Devices and Circuits
  ** Dept. Measurement, Control and Microtechnology
  
  
• Analysis of Wide Band Gap Material Properties From Device
  Characteristics Using Device Simulation
  Lades, M.; Pschenitzka, F.; Wachutka, G.
  Technical University München, Dept. for Physics of Electrotechnology, Germany
  
  
• Materials Characterisation Services to the Semiconductor Industry
  (invited)
  Crossley, A.; Johnston, C.; Cullen, F.; Fairchild, J.; Montgomery, N.;
  Mapledoram, L.; Sofield, C.
  AEA Technology plc, Oxfordshire, U.K.
  
  
• Interface Reactions Between Titanium Silico-Carbides and Au,
  Al or Pd at 600°C
  Wenzel, R.; Goesmann, F.; Schmid-Fetzer, R.
  Technical University Clausthal, Electronic Materials, Germany
  
  
• Temperature Effects in Alloy Metal and 6H-SiC Substrate Schottky
  Contacts Caused by the Current Suppressing Effect (invited)
  Rang, T.*; Blum, A.**
  * Tallinn Technical University, Institute of Electronics, Estonia
  ** University of Saarland, Institute of Electronics and
  Semiconductor Devices, Saarbrücken, Germany
  
  
• Electronic of SiC, CGe, and Their Related Alloys
  Rezki, M.*; Tadjer, A.*; Abid, H.*; Aourag, H.**
  University of Sidi-Bel-Abbes, Algeria
  * Semiconductor Materials Research Laboratory
  ** Computational Materials Science Laboratory
  
  
• High-Valued Thin-Film Resistors for Biomedical Applications
  Based on Nanocrystalline Silicon Carbon Alloys
  Eck, S.; Kraetschmer, H.; Bolz, A.; Schaldach, M.
  Friedrich-Alexander-University Erlangen-Nürnberg, Dept. of Biomedical Engineering, Germany
  
  
• Evaluation of the Carrier Trapping Model for the Interpretation and
  Prediction of Transport Properties of Polycrystalline Wide Bandgap
  Semiconductor Films (invited)
  Rutsch, G.*; Werner, M.**
  * University of Pittsburgh, Department of Electrical Engineering
  and Department of Physics, USA
  ** VDI/VDE-Technologiezentrum Informationstechnik GmbH, Teltow, Germany