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MicroMaterials Conference "MicroMat 1997"
Berlin , April 16 - 18 , 1997

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MicroMaterials 1997

Contacts

Review of
MicroMaterials '97

Procceedings of
MicroMaterials '97

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Plenary Lectures

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Microscopic Testing and Nanomicroscopy

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Mechanical Testing

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Advanced Measuring Techniques

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Packaging

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Micromechanics

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Cracks and Fracture in Microcomponents

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Strain and Stress Properties

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Thermal Aspects

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Technological and Environmental Aspects

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Wide Bandgap Semiconductors

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Piezoelectric Materials

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Nanocrystalline and Amorphous Materials

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Thin Films and Layers

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Polymeric Materials

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Ceramics and Superhard Materials

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Metallization

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Soldering and Bonding

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Sensors and Actuators

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Poster Show

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Pre-Conference Workshop
Proceedings of Micro Materials '97

14. Thin Films and Layers

  • Nondestructive Characterization of Surfaces and Thin Layers
    (Keynote Lecture)
    ´
    Meyendorf, N.; Altpeter, I.; Fassbender, S.U.; Netzelmann, U.

    Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren, Saarbrücken, Germany

  • NiTiHf Shape Memory Alloy Thin Films With High Transition
    Temperatures (invited)

    You, L.*; Han, X.D.*; Chung, C.Y.*; Qi, M.**; Gu, H.D.*;
    Leung, K.M.*; Lai, J.K.L.*; Chan, K.S.*

    * City University of Hong Kong, P.R. China
    ** Dalian University of Technology, P.R. China

  • Microstructure and Cohesion of Thin ZnO Interlayers in
    Metal-Duromer Heterostructures

    Morawietz, K.*; Busch, M.*; Katzer, D.*; Neu, A.**

    * Fraunhofer-Institut für Werkstoffmechanik, Außenstelle Halle/S., Germany
    ** Siemens AG, Regensburg, Germany

  • In Situ Nanomechanical Testing for the Determination of the Hardness
    of Thin Films or Individual Phases in Microstructured Materials

    Richarz, B.; Fries, T.
    Fries Research & Technology GmbH, Bergisch Gladbach, Germany

  • Charge Properties and Composition of the DyxOy-Si Interface
    Babushkina, N.V.

    Institute of Electronics, Belarussian Academy of Sciences, Minsk, Belarus

  • Stress-Strain Diagrams of Microfabricated Thin Films
    (Keynote Lecture)

    Ogawa, H.*; Suzuki, K.***; Kaneko, S.**; Nakano, Y.***; Ishikawa, Y.*

    * Mechanical Engineering Laboratory, AIST, MITI, Ibaraki , Japan
    ** Olympus Optical Co., Ltd, Tokyo, Japan
    *** Shonan Institute of Technology, Kanagawa, Japan

  • Nondestructive Testing and Determination of Thermal Parameters
    in Thin Films and Microcomponents

    Rohde, M.

    Forschungszentrum Karlsruhe, Institut für Materialforschung I, Germany

  • Study of the Vertical Thermo-Mechanical Properties of Polyimide Thin Films
    Willecke, R.; Ho, P.S.

    The University of Texas at Austin, Center for Materials Science and Engineering, USA

  • Effect of Fractal and Electroactive Surfaces on the Charge Transfer
    Across the Interface Between Electrode and Electrolyte

    Fröhlich, R.; Rzany, A.; Gerhäußer, A.; Bolz, A.; Schaldach, M.

    University of Erlangen-Nürnberg, Department of Biomedical Engineering, Germany

  • Erbium Photoluminescence in Sol-Gel Derived Oxide Films
    Gaponenko, N.V.*; Mudryi, A.V.*; Sergeev, O.V.*; Borisenko, V.E.*; Baran, A.S.**;
    Stepanova, E.A.**; Rat’ko, A.I.**; Baran, S.V.***; McGilp, J.F.****

    * Belarusian State University of Informatics and Radioelectronics, Minsk, Belarus
    ** Institute of General and Inorganic Chemistry, Minsk, Belarus
    *** "PHARMEC" Scientific and Production Enterprise, Minsk, Belarus
    **** Trinity College Dublin, Ireland