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MicroMaterials Conference "MicroMat 1997"
Berlin , April 16 - 18 , 1997

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MicroMaterials 1997

Contacts

Review of
MicroMaterials '97

Procceedings of
MicroMaterials '97

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Plenary Lectures

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Microscopic Testing and Nanomicroscopy

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Mechanical Testing

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Advanced Measuring Techniques

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Packaging

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Micromechanics

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Cracks and Fracture in Microcomponents

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Strain and Stress Properties

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Thermal Aspects

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Technological and Environmental Aspects

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Wide Bandgap Semiconductors

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Piezoelectric Materials

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Nanocrystalline and Amorphous Materials

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Thin Films and Layers

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Polymeric Materials

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Ceramics and Superhard Materials

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Metallization

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Soldering and Bonding

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Sensors and Actuators

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Poster Show

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Pre-Conference Workshop
Proceedings of Micro Materials '97

17. Metallization

  • The Development of the New Direction of Submicron Technologies
    for ULSI and Substitution of Au and Ag (Keynote Lecture)

    Khoperia, T.N.; Tabatadze, T.J.; Zedgenidze, T.I.

    Georgian Academy of Sciences, Institute of Physics, Tbilisi, Georgia

  • NiB - An Alternative Surface for PCBs
    Schmidt, R.; Hannemann, M.; Scheel, W.

    Fraunhofer Institute IZM Berlin, Germany

  • Reliable Under Bump Metallization for Solder Flip-Chip Contacts
    Thierbach, S.; Adolphi, B.; Preuß, A.

    Technische Universität Dresden, Institut für Halbleiter- und Mikrosystemtechnik, Germany

  • Excimer Lamp UV Activation of Lithium Niobate Substrates for Electroless Plating
    Campion, L.M.; O‘Reilly, M.; Kelly, P.V.; Crean, G.M.

    National Microelectronics Research Centre, Cork, Ireland

  • Chemical Composition and Deposition Rate of Copper Thin Films
    Deposited by LCVD on Silicon

    Jacquorie, M.*; Pfleging, W.*; Wesner, D.A.**; Kreutz, E.W.*

    * Rheinisch-Westfälische Technische Hochschule Aachen, Lehrstuhl für Lasertechnik, Germany
    ** Fraunhofer Institut für Lasertechnik, Aachen, Germany

  • Photoassisted Activation Process for Large Area Selective Electroless
    Metallisation on Ceramics Using Incoherent Ultraviolet Radiation

    Macauley, D.J.; Lafferty, E.J.; Kelly, P.V.; Mongey, K.F.; Crean, G.M.

    National Microelectronics Research Centre, Cork, Ireland