Fraunhofer Institute IZM Research:

• Silicon Graphics Workstations
  Origin 2000, Indigo² R 8000, Indigo² R 4400

• Hewlett Packard Workstations 9000/755 and 9000/735

• Access to CRAY XMP and further main frame computers

• Finite Element (FE) Development Software
  PATRAN, I-DEAS, ABAQUS, ANSYS

• In-house Finite Element Software ASTOR includingadaptive mesh generation, simulation kit for damage processes and crack propagation, non-linear material behavior (especially creep)

• microDAC Deformation Measurement System incl.
  scanning Electron Microscope (SEM) TESCAN TS 5120 Proxima,
  Specimen load stages for inside SEM applications and combined thermal/mechanical load, software codes VEDDAC and WinDAC for deformation field computation

• Extreme Long Distance Microscope QUESTAR SZM 100 for remote sensing

• CTE Measurement Tool Kit for thermal expansion coefficient measurement suited to anisotropic micro materials (preferably plastics, plastic layers)

• Laser Scanning Microscope ZEISS LSM 330 incl. OBIC (optical beam induced current) for semiconductor p/n-junctions, topographic analysis, autofocus option for profilometry, three wave length imaging

• Universal Material Testing Machine ZWICK 1446 incl. free programmable loading, heating chamber with optical access for deformation field measurement, tension, three/four-point bending, torsion load stages

• Steinbichler Optotechnik Speckle Interferometer incl.
  3D Measurement Head, software code FRAMES

• Scanning Autofocus System UBM 200/202/204 for surface profilometry incl. software code UBS OFT

• Interference Microscope ATOS MicroMap 512 with advanced phase shifting phase algorithms of phase extraction for optical profilometry

• Thermographic Equipment AGEMA Infrared Systems Thermovision LW 900

• Optical Microscope Neophot 32

• Modular System for Microfabrication and in-situ Measurement Purposes

• Dynamic Mechanical Analyzer for material relaxation measurements, T_g determination, Young’s modulus and loss modulus determination

• Computer Controlled Heating/Cooling Chamber for Microscopic Applications Linkam LTS 350

• Micro Hardness Tester Shimadzu HMV-2000

• Video Microscopy Tool micro-Scopeman MS-500A

• Metallographic Preparation Equipment

• SENTECH Spectral Multi Channel Ellipsometer

• Raster Tunnel Microscope STN 100

• Micro Material Testing Machine TMOD for torsion, compression, three/four-point bending under thermal load

• Micro Material Testing Device for thermal load suited for interferometric material stress and strain measurements

• Image Processing Tool ImageC for video metallography

• X-Ray Multi Purpose Diffraction System, Philips x’-Pert MPD System PH 3710/1830, PW 3020, PW 1821

• X-Ray Materials Research Diffractometer, Philips x-Pert MRD System PH 3040/00 incl. Stress Texture Cradle (STC)

• X-Rax Diffractometer STOE IP System incl.
  Imaging Plate, Seifert Generator